Each of the inspection systems in the new portfolio features seamless connectivity to the recently introduced eDR-7000 e-beam wafer defect review system. With outstanding sensitivity and review speed, ...

SAN JOSE –KLA-Tencor Corp. today said it is the first company to supply a fully automated system for inspection of wafer backsides during the production of 0.13-micron ICs on 300-mm silicon substrates ...

MILPITAS, Calif., July 10, 2018 /PRNewswire/ -- Today KLA-Tencor Corporation (NASDAQ: KLAC) announced two new defect inspection products, addressing two key challenges in tool and process monitoring ...

MILPITAS, Calif., Dec. 10, 2020 /PRNewswire/ -- Today KLA Corporation (NASDAQ: KLAC) announced two new products: the PWG5™ wafer geometry system and the Surfscan® SP7XP wafer defect inspection system.

KLA has announced the launch of four new products for automotive chip manufacturing: the 8935 high productivity patterned wafer inspection system, the C205 broadband plasma patterned wafer inspection ...

DUBLIN, March 9, 2021 /PRNewswire/ -- The "E-Beam Wafer Inspection Systems - Global Market Trajectory & Analytics" report has been added to ResearchAndMarkets.com's offering. The global market for ...

KLA KLAC is benefiting from strong spending in the Wafer Fabrication Equipment (“WFE”) market. The company expects the WFE ...

KLA extended its lead in the semiconductor metrology/inspection market by 3% vs. just 1% for Applied Materials and ASML. All three companies have a high exposure to TSMC, benefiting from the company's ...

LONDON-- (BUSINESS WIRE)--Technavio has been monitoring the semiconductor wafer inspection equipment market and it is poised to grow by USD 1.71 billion during 2020-2024, progressing at a CAGR of 8% ...

The shortage of semiconductors – the computer chips that products such as smartphones, laptops, cars and even washing machines rely on – continues to impact industries around the world. The current ...